-40%

JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX

$ 6124.8

Availability: 100 in stock
  • Model: 7505 WAFER INSPECTION SYSTEMS
  • Condition: Used
  • Country/Region of Manufacture: Japan
  • Brand: Jeol
  • UPC: Does not apply
  • All returns accepted: ReturnsNotAccepted
  • Jeol 7505 SEM: Jeol Scanning Electron Microscope
  • NORAN SYSTEMS: JEOL SEM
  • MPN: JWS-7505

    Description

    Jeol JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
    USED, UNABLE TO TEST, AVAILABLE FOR INSPECTION.
    INCLUDES: NORAN SYSTEMS EDX MODEL 700P128425
    SEIKO SEKI TURBO PUMP, MANUALS, ALL CABLES
    FOB OUR DOCK IN TEMPLE, TEXAS 76504, WE PREFER THAT BUYER ARRANGE FOR SHIPPING
    CURRENTLY SKIDDED, CRATING IS EXTRA
    LOGAN TECHNOLOGIES, LP 2547602424